ET AL., Lurwanu. Signature reliability of linear consecutive k-out-of-n:G system using universal generating function approach. JOURNAL OF BASICS AND APPLIED SCIENCES RESEARCH, [S. l.], v. 3, n. 4, p. 110–114, 2025. DOI: 10.4314/jobasr.v3i4.12. Disponível em: https://jobasrfudutsinma.com/index.php/ojs-files/article/view/176. Acesso em: 21 apr. 2026.